1. An introduction to logic circuit testing /
Author: Parag K. Lala
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
2. Analog test signal generation using periodic [sigma delta]-encoded data streams
Author: / by Benoit Dufort and Gordon W. Roberts
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Signal generators,Electronic circuits , Testing,Integrated circuits , Testing,Coding theory,Signal processing , Digital techniques,Analog-to-digital converters
Classification :
E-BOOK
3. Automatic testing and evalustion of digital integrated circuits
Author: Healy, James Thomas
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing ، Digital integrated circuits,، Automatic checkout equipment
Classification :
TK
7874
.
H395
4. CTL for test information of digital ICs /
Author: by Rohit Kapur.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Computer hardware description languages.,Digital integrated circuits-- Testing-- Standards.,Computer hardware description languages.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- General.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Integrated.
Classification :
TK7874
.
65
.
K35
2003eb
5. Designing, testing, and diagnostics- join them
Author: International Test conference )3991: Baltimore, Md.(
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits- Testing- congresses,، Electronic digital computers- Circuits- Testing-Congresses
Classification :
TK
7874
.
I474
1993
6. Developments in integrated circuit testing
Author: / Editor D.M.Miller
Library: Central Library and Document Center of Arak University (Markazi)
Subject: Digital integrated circuits-testing
Classification :
621
.
38173
M647d
7. Digital circuit testing
Author: / Francis C. Wang
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Digital integrated circuits - Testing
Classification :
TK
7874
.
W363
1991
8. Digital circuit testing : a guide to DFT and other techniques
Author: Wang, Francis C.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Digital integrated circuits-- Testing
Classification :
TK
7874
.
W363
1991
9. Digital circuit testing: a guide to DFT and other techniques
Author: Wang, Francis C.
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Digital integrated circuits- Testing
Classification :
TK
7874
.
W363
10. Digital circuit testing and testability
Author: Lala, Parag K.
Library: Central Library and Documentation Center (Kerman)
Subject: Testing ، Integrated circuits - Very large scale integration,Testing ، Digital integrated circuits,، Integrated circuits - Fault tolerance
Classification :
TK
7874
.
75
.
L35
1997
11. Digital circuit testing and testability
Author: Lala, Parag K.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Testing,، Digital integrated circuits-- Testing,، Integrated circuits-- Fault tolerance
Classification :
TK
7874
.
75
.
L35
1997
12. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit., Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
13. Digital integrated circuit testing from a quality perspective
Author: Hnatek, Eugene R.
Library: Central Library and Documentation Center (Kerman)
Subject: Testing - Quality control ، Digital integrated circuits
Classification :
TK
7874
.
H533
1993
14. Digital integrated circuits :design-for-test using Simulink and Stateflow
Author: Perelroyzen, Evgeni.
Library: Library of Niroo Research Institue (Tehran)
Subject: Testing ، Digital integrated circuits,Design and construction ، Digital integrated circuits
Classification :
TK
7874
.
P445
2007
15. Digital system test and testable design
Author: / Zainalabedin Navabi
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
Classification :
E-BOOK
16. Digital system test and testable design
Author: / Zainalabedin Navabi
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
Classification :
TK7874
.
N38
2011
17. Digital system test and testable design
Author: Zainalabedin Navabi
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
Classification :
TK
،
7874
،.
N38
،
2011
18. Digital systems testing and testable design
Author: Abramovici, Miron.
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Digital integrated circuits - Testing , Digital integrated circuits - Design and construction
Classification :
TK
7874
.
A23
19. Digital systems testing and testable design
Author: Abramovici, Miron
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Digital integrated circuits- Testing,، Digital integrated circuits- Design and construction
Classification :
TK
7874
.
A23
1990
